Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1991-08-30
1993-06-08
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158F, G01R 1073, G01R 3102
Patent
active
052182932
ABSTRACT:
A logic probe system for an integrated circuit device under test, such as a dual in-line package (DIP) device having a plurality of spaced-apart signal pins, comprises a probe header, including a plurality of signal contacts, and a plurality of ground contacts in the probe header body. The signal contacts each include a spring contact for tightly coupling the signal contact to the pins of the device under test, and a pin end protruding from the header body. The ground contacts each comprise a ground pin end protruding upwardly from the header body, and a distal end conductively secured to a ground plane extruding through the header body. An attenuator clip couples one of the signal pins and an adjacent ground pin to an external measuring device in series with a fixed-value resistor. The signal contacts preferably are arranged in parallel rows proximate to the side edges of the header body. The ground contacts are likewise arranged in a second, inboard spaced-apart pair of rows. The attenuator comprises a fixed-value resistor coupled in series with an input socket and an output pin and a ground conductor extending therethrough. The invention further provides a method for testing an integrated circuit, using the device described above, wherein the device is secured to a device under test and coupled using the attenuator clip to a measuring device.
REFERENCES:
patent: 3054078 (1962-09-01), Baschkin
patent: 3551878 (1970-12-01), Rossman
patent: 3587029 (1971-07-01), Knowles
patent: 3778754 (1973-12-01), Takahashi et al.
patent: 3829818 (1974-08-01), Iosue et al.
patent: 3880493 (1975-04-01), Lockhart, Jr.
patent: 3968433 (1976-07-01), Dobarganes
patent: 4030793 (1977-06-01), Hanlon et al.
patent: 4055806 (1977-10-01), Patel
patent: 4222626 (1980-09-01), Hollyday et al.
patent: 4326765 (1982-04-01), Brancaleone
patent: 4419626 (1983-12-01), Cedrone et al.
patent: 4428633 (1984-01-01), Lundergan et al.
patent: 4478476 (1984-10-01), Jones
patent: 4689556 (1987-08-01), Cedrone
patent: 4749362 (1988-06-01), Hoffman et al.
patent: 5014002 (1991-05-01), Wiscombe et al.
Brochure of ITT Pomona Electronics, "Surface Mount Device Interconnects", pp. 14-18 and 413-416.
Brochure of Scanbe Manufacturing Corporation, "Dual Inline Packaging", pp. 6 and 9.
LandOfFree
Passive high-frequency signal probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Passive high-frequency signal probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Passive high-frequency signal probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1944854