Passivation scheme for oxide vertical cavity...

Coherent light generators – Particular active media – Semiconductor

Reexamination Certificate

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C372S041000, C372S049010, C372S050121, C372S054000

Reexamination Certificate

active

06862309

ABSTRACT:
A method for forming an oxide VCSEL (vertical cavity surface-emitting laser) includes forming a VCSEL structure, forming an oxidation cavity partially through the VCSEL structure, oxidizing a layer in the VCSEL structure, forming a first passivation layer over a surface of the oxidation cavity, and forming a second passivation layer over the first passivation layer. An oxide VCSEL structure includes a bottom mirror region, an active region atop the bottom mirror region, a top mirror region atop the active region, an oxidation cavity partially through the top mirror region, a first passivation layer covering a surface of the oxidation cavity, and a second passivation layer covering the first passivation layer. In both the method and the structure, the first passivation layer can be made of silicon nitride (SiN) while the second passivation layer can be made of silicon oxynitride (SiON).

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S. Xie et al., “Reliability of Oxide VCSELs in non-Hermetic Environments”, Proceedings of the 15th IEEE Laser and Electro-Optics Society Annual Meeting (LEOS 2002), Glasgow, Scotland, p. 544, paper WW2, Nov. 10-14, 2002.
S. Xie et al., “Reliability and Failure Mechanisms of Oxide VCSELs in non-Hermetic Environments”, Proceedings of SPIE vol. 4994, Vertical-Cavity Surface-Emitting Lasers VII, paper 4994-21, San Jose, CA, Jan. 25-31, 2003.
S. Xie et al., “Failure Mode Analysis of Oxide VCSELs in High Humidity and High Temperature”, IEEE/OSA Journal of Lighwave Technology, Mar. 2003 (in press).
Suning Xie et al., “Failure Mode Analysis of Oxide VCSELs in High Humidity and High Temperature”, Journal of Lightwave Technology, vol. 21, No. 4, Apr. 2003, pp. 1013-1019.

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