Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent
1998-09-14
2000-08-22
Fourson, George
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
438120, 438618, 438700, 438750, 438781, 438906, 438948, 438963, H01L 21308
Patent
active
061072028
ABSTRACT:
A method for stripping positive photoresist from a keyhole 17 in a passivation layer 18 before a heating process using NMP solvent strips after a photoresist strip. The process is summarized by the 5 steps as follows: (1) Photoresist strip 1 (e.g., EKC 830), (2) Photoresist strip 2 (e.g., EKC 830 photoresist stripper), (3) N-methly-2-pyrolidone (NMP) solvent strip-agitated (solvent is preferably the same solvent in the photoresist stripper (1 &2) (4) NMP solvent strip-agitated and (5) H.sub.2 O rinse. The NMP solvent strip steps (3) and (4) remove photoresist residue (16, FIG. 1) in the key hole 17. This prevents the formation of photoresist extrusions 24 while annealing the metal lines 14.
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W.M. Moreau, Semiconductor Lithography Principles, Practices and Materials, Plenum Press, 1988, pp. 779-788.
Chiu Chih-Kang
Pan Sheng-Liang
Ackerman Stephen B.
Fourson George
Saile George O.
Stoffel William J.
Taiwan Semiconductor Manufacturing Company
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