Pass-line insensitive sensor

Optics: measuring and testing – By monitoring of webs or thread – For flaws or imperfections

Reexamination Certificate

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C356S431000, C356S445000

Reexamination Certificate

active

07397563

ABSTRACT:
Devices, systems and methods for detecting surface characteristics of a sample surface are disclosed. The exemplary system may have a conveying device for moving a sample surface and a light source for reflecting a beam of light off the sample surface. A light detector may receive the beam of light reflected from the sample surface. The area of the beam of light may be unequal to an area of a light detection surface of the light detector. A reference analyzer may determine the optical surface based on a comparison of the reflected light received with known reflected light values for known sample surfaces.

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patent: 6404502 (2002-06-01), Preston et al.
patent: 6588118 (2003-07-01), Hellstrom
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patent: 6762839 (2004-07-01), Zeylikovich et al.
patent: 6858436 (2005-02-01), Zenhausern et al.
patent: WO 98/49541 (1998-11-01), None
patent: WO 01/20308 (2001-03-01), None

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