Coating apparatus – Gas or vapor deposition – Crucible or evaporator structure
Reexamination Certificate
2008-11-14
2011-11-22
Zervigon, Rudy (Department: 1716)
Coating apparatus
Gas or vapor deposition
Crucible or evaporator structure
C156S345290, C118S7230VE
Reexamination Certificate
active
08062427
ABSTRACT:
Apparatus for metering and vaporizing a particulate material, includes a metering device for metering particulate material including: a reservoir for receiving particulate material; a housing having an internal volume and having first and second openings; a rotatable shaft disposed in the internal volume, the shaft having a smooth surface and a circumferential groove; a structure disposed in the reservoir for delivery and cooperating with the rotating shaft for fluidizing particulate material and transporting it from the reservoir into the groove; the shaft and internal volume cooperating such that particulate material is transported by the groove; a scraper cooperates with the groove to dislodge particulate material retained therein and fluidize the scraped particulate material, and deliver metered amounts of particulate material through the second opening; and a flash evaporator that receives and flash vaporizes the metered particulate material.
REFERENCES:
patent: 2190592 (1940-02-01), Clayton
patent: 2191255 (1940-02-01), Bonotto
patent: 2233109 (1941-02-01), Ness et al.
patent: 2241425 (1941-05-01), Schmidt
patent: 2392764 (1946-01-01), Reeves
patent: 2447789 (1948-08-01), Barr
patent: 2665168 (1954-01-01), Kerlin
patent: 2743158 (1956-04-01), Webb et al.
patent: 2771836 (1956-11-01), Denehie et al.
patent: 3754529 (1973-08-01), Fleischner
patent: 4532272 (1985-07-01), Wilt et al.
patent: 4616055 (1986-10-01), Mason
patent: 4769292 (1988-09-01), Tang et al.
patent: 4885211 (1989-12-01), Tang et al.
patent: 5090498 (1992-02-01), Hamill
patent: 5709827 (1998-01-01), Andersen et al.
patent: 6383301 (2002-05-01), Bell et al.
patent: 6470737 (2002-10-01), De Bona et al.
patent: 6685762 (2004-02-01), Brewster et al.
patent: 6734142 (2004-05-01), Massmann et al.
patent: 6832887 (2004-12-01), Baer et al.
patent: 7044288 (2006-05-01), Baer et al.
patent: 7141532 (2006-11-01), Graham et al.
patent: 7288285 (2007-10-01), Long et al.
patent: 7288286 (2007-10-01), Long et al.
patent: 7501151 (2009-03-01), Long et al.
patent: 7501152 (2009-03-01), Long et al.
patent: 7625601 (2009-12-01), Long et al.
patent: 7625602 (2009-12-01), Long et al.
patent: 7638168 (2009-12-01), Boroson et al.
patent: 2006/0062915 (2006-03-01), Long et al.
patent: 2006/0062918 (2006-03-01), Long et al.
patent: 2006/0062919 (2006-03-01), Long et al.
patent: 2006/0157322 (2006-07-01), Baer et al.
patent: 2006/0177576 (2006-08-01), Long et al.
patent: 2006/0251811 (2006-11-01), Long et al.
patent: 2007/0026146 (2007-02-01), Long et al.
patent: 2007/0084700 (2007-04-01), Baer et al.
patent: 2007/0092645 (2007-04-01), Long et al.
patent: 2007/0104864 (2007-05-01), Boroson et al.
patent: 2009/0081365 (2009-03-01), Cok et al.
patent: 2009/0176016 (2009-07-01), Long et al.
patent: 2010/0122656 (2010-05-01), Long et al.
patent: 2010/0122658 (2010-05-01), Long et al.
patent: 2010/0122659 (2010-05-01), Long et al.
patent: 0982411 (2000-03-01), None
patent: 2003 193218 (2003-07-01), None
V.E. Danilchenko, et al. “Method of Discrete Evaporation in Vacuo,” Instruments and Experimental Techniques, Institute of Physics, Academy of Sciences of the Ukrainian SSR, Kiev, May-Jun. 1968.
Long Michael
Palone Thomas W.
Global OLED Technology LLC
Morgan & Lewis & Bockius, LLP
Zervigon Rudy
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