Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1996-02-26
1999-07-27
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356335, 356339, 356436, 250574, G01B 1100
Patent
active
059299886
ABSTRACT:
Light emitted from a light emitting element is converted into parallel light by a lens, and a light receiving element detects scattered light occurring due to particulate existent in a fan-shaped field pattern spreading along the optical path of the parallel light. Since parallel light is used, stray light can be processed within a limited space. Furthermore, since the scattered light of parallel light which occurs due to the particulate is detected using the fan-shaped field pattern, particulate detection can be performed on volumes of air at a high signal-to-noise ratio.
REFERENCES:
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patent: 4168438 (1979-09-01), Morisue
patent: 4226533 (1980-10-01), Snowman
patent: 4397557 (1983-08-01), Herwig et al.
patent: 4906978 (1990-03-01), Best et al.
patent: 5132548 (1992-07-01), Borden et al.
patent: 5302837 (1994-04-01), Sawa et al.
Kim Robert H.
Nohmi Bosai Ltd.
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