Particle trigger and delay generation system

Details Particle trigger and delay generation system Particle trigger and delay generation system

1986-06-04

1988-10-11

Anderson, Bruce C.

Radiant energy

Electrically neutral molecular or atomic beam devices and...

250307, 250308, G21K 500

Patent

active

047773626

ABSTRACT:
A device to measure the extremely fast electrical waveform generated when atomic or subatomic particles of an identical type strike an electronic circuit or device. The device comprises a trigger element which signals the incidence of a particle on the electronic device and a picosecond sampler which receives the trigger signal and the waveform generated by the electronic device. The sampler obtains a measurement of a discrete point on the generated waveform each time a particle passes through the trigger element to the electronic device. The sampling point on the waveform can be moved by various techniques so that the entire waveform may be measured by the sampler.

REFERENCES:
patent: 3450879 (1969-06-01), Seppi
patent: 3691381 (1972-09-01), Kleppner
patent: 3949210 (1976-04-01), Eichinger
patent: 4401900 (1983-08-01), Faris
G. A. Mouru, et al. (ed), "Picosecond Electronics and Optoelectronics", Springer-Verlag (Berlin), 1985, pp. 236-243.

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