Radiant energy – With charged particle beam deflection or focussing – With target means
Reexamination Certificate
2006-04-25
2006-04-25
Wells, Nikita (Department: 2881)
Radiant energy
With charged particle beam deflection or focussing
With target means
C250S3960ML, C250S3960ML, C250S311000, C250S305000
Reexamination Certificate
active
07034315
ABSTRACT:
The invention describes a particle source in which energy selection occurs. The energy selection occurs by sending a beam of electrically charged particles13eccentrically through a lens6. As a result of this, energy dispersion will occur in an image15formed by the lens6. By projecting this image15onto a diaphragm7, it is possible to only allow particles in a limited portion of the energy spectrum to pass. Consequently, the passed beam16will have a reduced energy spread. By adding a deflection unit10, this particle beam16can be deflected toward the optical axis2. One can also elect to deflect a beam12going through the middle of the lens6—and having, for example, greater current—toward the optical axis.
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S. Uhlemann and M. Haider, “Experimental Set-Up of a Fully Electrostatic Monochromator for a 200 kV TEM,” the proceedings of the 15th International Congress on Electron Microscopy, session 5/S14. held in Durban, South Africa, Sep. 1-6, 2002.
Gerd Benner, Erik Essers, Bernd Huber and Alexander Orchowski, “Design and First Results of SESAM,” LEO Elektronenmikroskople GmbH, Carl Zeiss S-M-T AG, D-73447 Oberkochen, Germany.
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Chmelik Jaroslav
Henstra Alexander
FEI Company
Scheinberg Michael O.
Smith, II Johnnie L.
Wells Nikita
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