Particle size measuring system

Details Particle size measuring system Particle size measuring system

1989-09-28

1991-05-14

Willis, Davis L.

Optics: measuring and testing

For size of particles

By particle light scattering

356335, 356337, G01N 1502

Patent

active

050150944

ABSTRACT:
There is disclosed a system in which, according to the time domain method, a laser light is irradiated to an object to be measured, photon pulses based on the scattering light from the object to be measured are received, time series data are generated based on the light receiving signal, and based on the time series data thus generated, the particle size distribution of particles in the object to be measured is measured. Thus, the present invention achieves a considerable reduction in time required for finally obtaining the particle size based on the measured data, as compared with a conventional system using a calculator program.

REFERENCES:
patent: 4830494 (1989-05-01), Ishikawa et al.

Affiliated with

Also associated with

Rating

Particle size measuring system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Particle size measuring system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Particle size measuring system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1644129