Optics: measuring and testing – For size of particles – By particle light scattering
Patent
1990-08-31
1992-04-14
Rosenberger, Richard A.
Optics: measuring and testing
For size of particles
By particle light scattering
356343, 356367, G01N 1502, G01N 2153
Patent
active
051042215
ABSTRACT:
Two arrangements are disclosed to provide high resolution measurement of sub-micrometer and micrometer particle size distributions. In a first arrangement, scattered light is measured over a wide range of scattering angles. At the same time, light scattered at low scattering angles is measured with high angular resolution. In the second arrangment, an improved Polarization Intensity Differential Scattering (PIDS) measurement is made possible by providing an interrogating light beam of selected wavelength including a first component having a linear polarization plane and a second component having a differential linear polarization plane, wherein the linear polarizations of the components are orthogonal. Photodetecting arrays in one or more scattering planes detect light scattered by the particles at least at two scattering angles.
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Bott Steven E.
Hart W. Howard
Coulter Electronics of New England, Inc.
Rosenberger Richard A.
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