Particle size analysis utilizing polarization intensity differen

Details Particle size analysis utilizing polarization intensity differen Particle size analysis utilizing polarization intensity differen

1989-03-03

1990-09-04

Willis, Davis L.

Optics: measuring and testing

For size of particles

By particle light scattering

356343, 356367, G01N 1502, G01N 2153

Patent

active

049539787

ABSTRACT:
Two arrangements are disclosed to provide high resolution measurement of sub-micrometer and micrometer particle size distributions. In a first arrangement, scattered light is measured over a wide range of scattering angles. At the same time, light scattered at low scattering angles is measured with high angular resolution. In the second arrangement an improved Polarization Intensity Differential Scattering (PIDS) measurement is made possible by providing an interrogating light beam of selected wavelength including a first component parallel to the scattering plane and a second component perpendicular to the scattering plane. Photodetecting arrangements detect light scattered by the particles at least at two scattering angles.

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