Particle removal wafer

Gas separation: processes – Liquid contacting – On surface extending mass

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

95237, 55282, B01D 4714

Patent

active

057626880

ABSTRACT:
A particle removal wafer including ridges defining recessed areas and sticky material placed in these recessed areas can be run through wafer processing equipment. The particle removal wafer can remove particles that would otherwise adhere to the backs of wafers run through this equipment. Particles adhering to the backs of wafers are a problem in the photolithographic steps. These particles cause the focus of the photolithographic system to be off and thus can cause fatal errors. By removing the particles which could adhere to the backs of wafers from the wafer fabrication equipment, the accuracy of the photolithographic process can be improved.

REFERENCES:
patent: 5344693 (1994-09-01), Sanders

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Particle removal wafer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Particle removal wafer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Particle removal wafer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2194447

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.