Particle pattern judging method

Details Particle pattern judging method Particle pattern judging method

1993-06-24

1995-02-14

Redding, David A.

Chemistry: analytical and immunological testing

Optical result

436 63, 436805, 422 73, 356 39, 356434, 356441, 73 6441, 382 6, G01N 2175, G01N 3380

Patent

active

053895550

ABSTRACT:
Particle pattern judging method in which a particle pattern formed on the bottom surface of a reaction vessel by an immunological agglutinated reaction is measured in an optical manner; a variation ratio of light intensity of the border of the particle pattern is obtained and the particle pattern is judged whether it is agglutinated or not on the basis of the variation ratio: or a two-dimensional image of the particle pattern is picked up; the two-dimensional image of the particle pattern is differentiated to obtain differentiated values concerning pixel compositions consisting of the particle pattern; and the particle pattern is judged whether it is agglutinated or not on the basis of a distribution of the thus obtained differentiated values. By the method according to the invention, it is possible to judge whether the particle pattern is agglutinated or not in an exact manner, even when bubbles are included in the particle pattern, or the particle pattern is destroyed, or the particle pattern is torn or the agglutinating force of the particle pattern is weak.

REFERENCES:
patent: 4556641 (1985-12-01), Kano
patent: 4563430 (1986-01-01), Kano
patent: 4575492 (1986-03-01), David et al.
patent: 4727033 (1988-02-01), Hijikata
patent: 4794450 (1988-12-01), Saito

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