Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate
2007-06-13
2009-06-30
Souw, Bernard E (Department: 2881)
Radiant energy
With charged particle beam deflection or focussing
Magnetic lens
C250S310000, C250S311000, C250S492220, C250S492300
Reexamination Certificate
active
07554094
ABSTRACT:
An electron-optical arrangement provides a primary beam path for a beam of primary electrons and a secondary beam path for secondary electrons. The electron-optical arrangement includes a magnet arrangement having first, second and third magnetic field regions. The first magnetic field region is traversed by the primary beam path and the secondary beam path. The second magnetic field region is arranged in the primary beam path upstream of the first magnetic field region and is not traversed by the secondary beam path. The first and second magnetic field regions deflect the primary beam path in substantially opposite directions. The third magnetic field region is arranged in the secondary beam path downstream of the first magnetic field region and is not traversed by the first beam path. The first and third magnetic field regions deflect the secondary beam path in a substantially same direction.
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Casares Antonio
Haider Maximilian
Kemen Thomas
Kienzle Oliver
Knippelmeyer Rainer
Applied Materials Israel
Carl Zeiss SMT A.G.
Souw Bernard E
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