Particle measuring apparatus

Details Particle measuring apparatus Particle measuring apparatus

1998-05-01

2000-10-17

Kim, Robert H.

Optics: measuring and testing

For optical fiber or waveguide inspection

356337, 422 8205, 436 63, G01N 2100

Patent

active

061339954

ABSTRACT:
A particle measuring apparatus includes a characteristic parameter extracting device for extracting a plurality of characteristic parameters from each particle in a sample, and a distribution diagram preparing device for preparing a first distribution diagram on the basis of the extracted characteristic parameters. It further includes a first separating device for separating a cluster including target particles from others on the prepared first distribution diagram. In addition, a discriminating device is included for setting a specified discrimination standard for the separated cluster including the target particles and for judging whether the particles in the cluster are target particles or non-target particles on the basis of the discrimination standard. Finally, a counting device is included for counting the number of the target particles on the basis of a discrimination result of the discriminating device.

REFERENCES:
patent: 5679575 (1997-10-01), Kubota et al.
patent: 5719666 (1998-02-01), Fukuda et al.
patent: 5731867 (1998-03-01), Katayama
patent: 5757476 (1998-05-01), Nakamoto et al.
patent: 5824269 (1998-10-01), Kosaka et al.
"Japan Internal Medicine Journal" "Platelet Function Test and Problems Thereof", Tsukada Toshiyasu, pp. 822-827.

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