Gas separation: apparatus – Electric field separation apparatus – Including gas flow distribution means
Reexamination Certificate
2005-04-05
2005-04-05
Smith, Duane (Department: 1724)
Gas separation: apparatus
Electric field separation apparatus
Including gas flow distribution means
C096S069000, C096S072000, C055S385100, C055S385600, C055S442000, C055S484000, C055S522000, C055S524000, C055S529000, C216S002000, C216S011000, C216S013000, C216S041000, C216S056000, C428S641000, C427S058000
Reexamination Certificate
active
06875257
ABSTRACT:
A particle filter for microelectromechanical systems is provided that includes a particle trap formed on a substrate material. The particle trap includes an array of multidimensional geometric structures in an adjacent relationship. The geometric structures further define a plurality of multidimensional voids therebetween for trapping particles therein. The individual multidimensional geometric structures are formed by a plurality of vertically interconnected geometric shapes to define different configurations of voids between the adjacent geometric structures. In one embodiment of the filter system, an electrical bias is applied to the array of multidimensional geometric structures to facilitate attracting and trapping of particles in the filter.
REFERENCES:
patent: 4690750 (1987-09-01), Roxlo et al.
patent: 5882496 (1999-03-01), Northrup et al.
patent: 5938923 (1999-08-01), Tu et al.
patent: 6110247 (2000-08-01), Birmingham et al.
patent: 6120573 (2000-09-01), Call et al.
patent: 6187412 (2001-02-01), Armacost et al.
patent: 6524488 (2003-02-01), Insley et al.
Greene Jason M.
Marsh & Fischmann & Breyfogle LLP
MEMX, Inc.
Smith Duane
LandOfFree
Particle filter for microelectromechanical systems does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Particle filter for microelectromechanical systems, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Particle filter for microelectromechanical systems will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3405835