Optics: measuring and testing – For size of particles – By particle light scattering
Reexamination Certificate
2006-08-01
2006-08-01
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
For size of particles
By particle light scattering
Reexamination Certificate
active
07084975
ABSTRACT:
A particle diameter distribution measurement apparatus and method includes a sample cell that can be irradiated by a source of light. A plurality of detectors are positioned operatively adjacent to the sample cell to measure light interacting with a specimen in the sample cell. A storage unit stores values representative of outputs of the detectors for a plurality of standard particle sizes. The representation outputs extend across a range of detection for a plurality of detectors. A controller unit can perform a calibration based on the stored values and an actual measurement of one or more standard particle sizes that has the capability of providing a range of detection that will be inclusive of a standard particle size that is not available for measurement.
REFERENCES:
patent: 4801205 (1989-01-01), Tatsuno
patent: 6741350 (2004-05-01), Ikeda et al.
patent: 61-014543 (1986-01-01), None
Ikeda Hideyuki
Nakano Yuki
Horiba Ltd.
Nguyen Tu T.
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