Particle detecting system

Details Particle detecting system Particle detecting system

1974-08-19

1976-08-17

Corbin, John K.

Optics: measuring and testing

Refraction testing

Prism engaging specimen

250574, 356244, 240 2M, 350 87, 350 91, G01N 2100, G02B 2106

Patent

active

039750841

ABSTRACT:
Submicron-sized particles are detected by a system which observes emission, as by scattering or by fluorescence from particles undergoing Brownian motion in a region of a fluid medium excited by an evanescent wave created adjacent an interface between the fluid medium and a multiple internal totally reflecting cell or light guide. The excited region can range in depth between several wavelengths and a fraction of the wavelength of the exciting beam, hence serves as an "aperture" having a dimension of about the same order of magnitude as the particles being detected. The particles can be classified according to size by examining the amplitude modulation arising out of the motion of the particles through the aperture.

REFERENCES:
patent: 3542482 (1970-11-01), Wilks, Jr.
patent: 3604927 (1971-09-01), Hirschfeld
patent: 3720470 (1973-03-01), Berkhan

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