Particle counter with self-concealing aperture assembly

Details Particle counter with self-concealing aperture assembly Particle counter with self-concealing aperture assembly

2006-08-08

2006-08-08

Nguyen, Tu T. (Department: 2877)

Optics: measuring and testing

By particle light scattering

With photocell detection

Reexamination Certificate

active

07088447

ABSTRACT:
A particle measurement system using a single component light collecting system with an aperture having a portion within direct view of the light detector. An aperture assembly extending into a sample may be self-concealing by having an extended portion to block light from directly illuminating the light detector. Alternatively, a smooth, reflective inside surface of the aperture assembly provides for self-concealment by causing spontaneous emitted light to have low angles of reflection. In either case, spontaneously emitted light is substantially prevented from reflecting directly into the light detector, thereby reducing light noise to the level of molecular noise.

REFERENCES:
patent: 4226532 (1980-10-01), Berber et al.
patent: 5085500 (1992-02-01), Blesener
patent: 5872627 (1999-02-01), Miers

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