Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Using radiant energy
Patent
1985-12-27
1991-01-15
Wieder, Kenneth
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Using radiant energy
324537, 324158R, G01R 3100
Patent
active
049856812
ABSTRACT:
For testing an interconnect network for shorts and interruptions, a point of the network to be tested is charged with a particle beam. Subsequently, a potential at least one further contact point is read with the same particle beam and an unaltered primary energy. An identification of potential occurs by documenting the secondary electrons triggered at the contact points. In order to avoid a disturbing change of potential during the measuring phase, the measuring time is only a fraction of the time for charging the network.
REFERENCES:
patent: 3531716 (1970-09-01), Tarui et al.
patent: 3549999 (1970-12-01), Norton
patent: 3796947 (1974-03-01), Harrod et al.
patent: 4169244 (1979-09-01), Plows
patent: 4417203 (1983-11-01), Pfeiffer et al.
patent: 4443278 (1984-04-01), Zingher
patent: 4573008 (1986-02-01), Lischke
patent: 4577147 (1986-03-01), Frosien et al.
patent: 4578279 (1986-03-01), Zingher
patent: 4621232 (1986-11-01), Chang et al.
Journal of Physics; vol. 3, Oct. 1970, "Electron Beam Testing of Wired or Printed Circuit Modules" by J. M. Engel et al, pp. 1505-1508.
"Noncontact Testing of Interconnections in Film Integrated Circuits Using an Electron Beam" by J. M. Sebeson et al, Bell Telephone Laboratories, 1973, pp. 138-145.
"Electron-Beam Testing of VLSI Circuits" by Wolfgang et al, 8093 IEEE Trans. on Electron Devices, vol. ED-26, No. 4 Apr., 1979, pp. 549-559.
"Tri-Potential Method for Testing Electrical Opens and Shorts in Multi-Layer Ceramic Packaging Modules", by T. P. Chang et al, IBM Technical Disclosure Bulletin, vol. 24, No. 11A, Apr., 1982, pp. 5388-5390.
Brunner Matthias
Frosien Juergen
Lischke Burkhard
Schmitt Reinhold
Edmonds W.
Siemens Aktiengesellschaft
Wieder Kenneth
LandOfFree
Particle beam measuring method for non-contact testing of interc does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Particle beam measuring method for non-contact testing of interc, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Particle beam measuring method for non-contact testing of interc will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-57039