Particle analyzing method and device for realizing same

Details Particle analyzing method and device for realizing same Particle analyzing method and device for realizing same

1990-12-17

1992-11-24

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

356 39, G01N 1506

Patent

active

051665379

ABSTRACT:
According to the present invention, the accuracy of particle size histograms produced from data relating to an impedance variation (Coutler Counter Method) caused by particles passing between electrodes disposed on either side of an orifice through which the particles pass is improved by excluding false data from the data used in producing the histograms, the false data resulting from more than one particle being resident in the orifice at a given data collection time. The preferred embodiment employs a light detecting method and apparatus to detect false readings and to provide correction information used to correct data obtained by the Coulter Counter Method and apparatus.

REFERENCES:
patent: 2656508 (1953-10-01), Coulter
patent: 4263508 (1981-04-01), Leary et al.
patent: 4341993 (1982-07-01), Brunsting et al.
patent: 4348107 (1982-09-01), Leif
patent: 4374644 (1983-02-01), Armstrong
patent: 4696571 (1987-09-01), Goldberg et al.

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