Particle analyzing device with changeable aperture means

Details Particle analyzing device with changeable aperture means Particle analyzing device with changeable aperture means

1974-12-17

1976-05-18

Corbin, John K.

Electricity: measuring and testing

Determining nonelectric properties by measuring electric...

Erosion

73432PS, G01B 2702, G01R 2700

Patent

active

039581772

ABSTRACT:
A particle analyzing device in which a suspension of particles in a fluid medium is passed through an aperture in a strip of plastic material, and the change in the conductivity of the suspension across the aperture, each time a particle flows through the aperture, is detected so that the number and volume of particles for a given quantity of the suspension can be determined. The strip can be provided with a plurality of scanning apertures and be selectively moved across the flow path to bring a new aperture into an operative position in the flow path, such as when an aperture becomes clogged by debris.

REFERENCES:
patent: 3475965 (1969-11-01), Koblin et al.
patent: 3485086 (1969-12-01), Roman
patent: 3614607 (1971-10-01), Schoen
patent: 3672507 (1972-06-01), Paull, Jr.
patent: 3815024 (1974-06-01), Bean et al.

Affiliated with

Also associated with

Rating

Particle analyzing device with changeable aperture means does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Particle analyzing device with changeable aperture means, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Particle analyzing device with changeable aperture means will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2239025