Particle analyzing apparatus and method wherein an optical defle

Details Particle analyzing apparatus and method wherein an optical defle Particle analyzing apparatus and method wherein an optical defle

1993-10-21

1995-09-05

McGraw, Vincent P.

Optics: measuring and testing

For optical fiber or waveguide inspection

2504612, 356 39, G01N 1514

Patent

active

054483492

ABSTRACT:
A particle image analyzing apparatus including, a flow cell for enclosing a solution containing a particle to be analyzed in a sheathed flow to form the solution into a sample solution flow, an irradiation optical system for emitting light to irradiate the sample solution flow, a one dimension image sensor for receiving the light transmitted through the particle to scan the particle and output an image signal, an optical deflection device, including a variable deflection angle, for deflecting the emitted light introduced into the sample solution flow, a controller for controlling the deflection angle of the optical deflection device to permit the emitted light to optically track and irradiate the particle, and a signal processor for processing the output image signal of the image sensor to analyze the particle.

REFERENCES:
patent: 4293221 (1981-10-01), Kay et al.
patent: 4338024 (1982-05-01), Bolz et al.
patent: 4643565 (1987-02-01), Goto

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