Particle analyzer having scanning apparatus series coupled betwe

Details Particle analyzer having scanning apparatus series coupled betwe Particle analyzer having scanning apparatus series coupled betwe

1971-12-08

1976-11-23

Corbin, John K.

Electricity: measuring and testing

Determining nonelectric properties by measuring electric...

Erosion

324 30R, G01N 2700, G01N 2742

Patent

active

039939480

ABSTRACT:
A particle analyzer having a low impedance low voltage d.c. source series connected to a scanner and the parallel combination of a d.c. short-circuiting device and a high input impedance, voltage sensitive signal detector. A d.c. current flowing in the scanning ambit is modulated by the passage of particles therein. The detection of particles is unaffected by long term changes in the conductivity of the fluid medium which carries the particles within the scanning ambit, since the d.c. current then flowing in the scanning ambit is caused to be deliberately variable and inversely proportional to the resistivity of the fluid medium.

REFERENCES:
patent: 2656508 (1953-10-01), Coulter
patent: 2683986 (1954-07-01), Bartlett et al.
patent: 2702471 (1955-02-01), Vonnegut
belt W. and Kaizer C., D.C. Power Supplies In System Designer's Handbook-Electrochemical Design July 1964, pp. 181-193.

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