Particle analysis system with photochromic filter

Details Particle analysis system with photochromic filter Particle analysis system with photochromic filter

1976-06-10

1978-06-20

Engle, Samuel W.

Optics: measuring and testing

Refraction testing

Prism engaging specimen

356102, 350357, G01N 2100, G01N 1502, G02B 523

Patent

active

040958981

ABSTRACT:
A background light filter for use in an optical particle analysis system operates to attenuate light coupled thereto and pass an attenuated intensity light signal. If the light coupled to the filter takes the form of discrete beams or areas forming a pattern, the filter will selectively attenuate in only those portions of the filter struck by the light beams forming the pattern. The optical filter is substantially insensitive to short term variations in light coupled thereto so that changes in the received light pattern which may, for example, be produced by passage of a particle through the light beam producing the pattern, will be passed through the optical filter with substantially no attenuation.

REFERENCES:
patent: 3208860 (1965-09-01), Armistead
patent: 3703388 (1972-11-01), Araujo
patent: 3705771 (1972-12-01), Friedman
patent: 3710933 (1973-01-01), Fulwyler
patent: 3714430 (1973-01-01), Finvold
patent: 3716747 (1973-02-01), Patel
patent: 3781112 (1973-12-01), Groner
patent: 3893767 (1975-07-01), Fulwyler

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