Partial probe mapping

Details Partial probe mapping Partial probe mapping

1998-01-09

1999-10-26

Lobo, Ian J.

Communications: directive radio wave systems and devices (e.g.,

Determining distance

Material level within container

G01S 1308

Patent

active

059736372

ABSTRACT:
A method for processing a time domain reflectometry (TDR) signal having a plurality of reflection pulses to generate a valid output result corresponding to a process variable for a material in a vessel. The method includes the steps of determining a background signal for a probe and detecting a sample TDR signal for the probe in the vessel. At least one transition point is established on the sample TDR signal and the background signal. A portion of the sample TDR signal on one side of the at least one transition point is combined with a portion of the background signal on the other side of the at least one transition point to establish an initial boundary signal, and the initial boundary signal is stored. The method also includes the steps of detecting the TDR signal and calculating the output result using the initial boundary signal.

REFERENCES:
patent: 3832900 (1974-09-01), Ross
patent: 3922914 (1975-12-01), Fuchs
patent: 3995212 (1976-11-01), Ross
patent: 4135397 (1979-01-01), Krake
patent: 4301681 (1981-11-01), Maltby et al.
patent: 4322832 (1982-03-01), Sartorius
patent: 4698634 (1987-10-01), Alongi et al.
patent: 4713538 (1987-12-01), Theocharous
patent: 4743906 (1988-05-01), Fullerton
patent: 4813057 (1989-03-01), Fullerton
patent: 4979186 (1990-12-01), Fullerton
patent: 5020374 (1991-06-01), Petroff et al.
patent: 5122800 (1992-06-01), Philipp
patent: 5226328 (1993-07-01), Petroff et al.
patent: 5323361 (1994-06-01), Elle et al.
patent: 5333508 (1994-08-01), Petroff et al.
patent: 5345471 (1994-09-01), McEwan
patent: 5361070 (1994-11-01), McEwan
patent: 5363108 (1994-11-01), Fullerton
patent: 5376888 (1994-12-01), Hook
patent: 5420517 (1995-05-01), Skaling et al.
patent: 5436580 (1995-07-01), Kellmann et al.
patent: 5457990 (1995-10-01), Oswald et al.
patent: 5517198 (1996-05-01), McEwan
patent: 5614911 (1997-03-01), Otto et al.
patent: 5656774 (1997-08-01), Nelson et al.
patent: 5661251 (1997-08-01), Cummings et al.
patent: 5677927 (1997-10-01), Fullerton et al.
patent: 5767953 (1998-06-01), McEwan
patent: 5827985 (1998-10-01), Grieger et al.
patent: 5841666 (1998-11-01), Perdue et al.
Steven Arcone, "Conductivity Limitations in Single-Reflection Time-Domain Reflectometry," J. Phys. E. Sci. Instrum. 19 (1986), pp. 1067-1069.

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