Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...
Patent
1997-02-18
1999-02-09
Breneman, R. Bruce
Cleaning and liquid contact with solids
Processes
Including application of electrical radiant or wave energy...
216 60, 216 79, B08B 600, C25F 100
Patent
active
058688528
ABSTRACT:
A method for the dynamic cleaning of semiconductor fabrication equipment and particularly quartzware with a thermally activated source of fluorine, such as nitrogen trifluoride, at an elevated temperature, typically at the process operation temperature, wherein the cleaning is terminated prior to complete cleaning and removal of undesired substances allowing rapid restart of fabrication equipment so cleaned.
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"In Situ Cleaning of Silicon Nitride (Si.sub.3 N.sub.4) Process Quartzware Using a Thermal Nitrogen Trifluoride (NF.sub.3) Etch Process", Sematech Technology Transfer 96083161A-TR (Sep. 30, 1996) by A. D. Johnson, et al.
Johnson Andrew David
McGaughey Timothy Wayne
Pearce Richard Vincent
Schneider Charles Anthony
Air Products and Chemicals Inc.
Aspect Systems Inc.
Breneman R. Bruce
Chase Geoffrey L.
Goudreau George
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