Parametric tester for semiconductor devices

Details Parametric tester for semiconductor devices Parametric tester for semiconductor devices

1975-03-13

1976-10-26

Segal, Robert

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, 324158D, 324158T, G01R 3122

Patent

active

039886727

ABSTRACT:
A tester for conducting parametric tests on semiconductor devices comprises a current source means to be electrically coupled to a particular lead of the device under test to supply the maximum current specified to be drawn by said lead at a fixed voltage, a voltage maintenance means electrically coupled to the lead to maintain the lead at the specified voltage and a current direction-sensing means electrically coupled between the lead and the voltage maintenance means to detect the direction of current flow to determine whether the lead draws more or less current than the constant current.

REFERENCES:
patent: 3622883 (1971-11-01), Haire

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