Parametric test circuit

Details Parametric test circuit Parametric test circuit

1996-03-12

1998-08-18

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324522, 324763, 326 16, 371 226, G01R 3102, G06F 1130

Patent

active

057962600

ABSTRACT:
A test circuit for input threshold voltage of an integrated circuit uses input pins and logic elements connected in a tree arrangement. The output of the tree controls programmable resistors to indicate pull-up or pull-down. The test circuit eliminates the need for a dedicated output pin for the testing formation.

REFERENCES:
patent: 5068547 (1991-11-01), Gascoyne
patent: 5117129 (1992-05-01), Hoffman et al.
patent: 5528162 (1996-06-01), Sato
patent: 5565766 (1996-10-01), Kuwahara et al.
patent: 5633599 (1997-05-01), Kubota

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