Parameterized preview array for iterative image optimization...

Television – Camera – system and detail – Camera connected to computer

Reexamination Certificate

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Details

C348S333050, C250S311000

Reexamination Certificate

active

07071969

ABSTRACT:
A method of adjusting focus and/or other image parameters in a remotely-operated image capturing system, such as a scanning electron microscope (SEM), is provided. The method minimizes transmission bandwidth and allows a remote user to perform adjustment quickly without requiring real-time feedback. In accordance with the method, rather than adjusting a knob or slider while viewing a real-time image as is done in prior art systems, the user selects among several still images representing a wide range of values of the adjustment in question. The user then selects from another set of images which represent a small subrange of values determined by the first choice. The process is repeated until the adjustment resolution of the instrument is reached or the user is satisfied. Adjustments, like objective lens alignment, which require “focus wobble” can also be made using this method. Since focus wobble is a periodic motion, it can be represented using a short loop of animation. This animation, when used in accordance with the present invention, can either be captured directly as a short burst of video or captured as a sequence of still images.

REFERENCES:
patent: 5426732 (1995-06-01), Boies et al.
patent: 6324695 (2001-11-01), Lee et al.
patent: 6677988 (2004-01-01), Usami
patent: 992944 (2000-04-01), None
patent: 1069764 (2001-01-01), None
patent: 64071377 (1989-03-01), None
John F. Mansfield et al.; “Development of a System to Provide Full, Real-time Remote Control of a Scanning Electron Microscope Across the Second Generation Internet: The Teaching SEM,”Microscopy and Microanalysis. vol. 6, pp. 31-41, 2000.
Christopher Morgan et al.; “Toward a Standard for Remote Microscope Control Systems,”Scanning, vol. 20, pp. 110-116, 1998.

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