Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-12-21
2009-11-10
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S064000, C702S065000, C702S074000
Reexamination Certificate
active
07617056
ABSTRACT:
A structure includes a step of inputting a numerical value of a parameter, which forms a model formula, by a computer; a step of inputting the numerical value of the parameter to the model formula and calculating a calculation value by the computer; and a step of evaluating degree of a match between an actual measurement value and the calculation value by the computer with an input/output response of an actual device assumed as the actual measurement value, in which the degree of the match is evaluated by a numerical value corresponding to an area of a portion sandwiched between a connecting line of the actual measurement value and a connecting line of the calculation value.
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European Search Report, European Patent Application No. 06026507.1, dated Mar. 7, 2007.
Cook Alex Ltd.
Feliciano Eliseo Ramos
Semiconductor Energy Laboratory Co,. Ltd.
Suarez Felix E
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