Parameter estimation apparatus and data matching apparatus

Image analysis – Applications – Personnel identification

Reexamination Certificate

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Details

C382S159000, C382S170000, C382S181000, C382S224000

Reexamination Certificate

active

10415884

ABSTRACT:
The present invention enables estimation of desired parameters with less computation cost and with high precision by inputting first training vectors generated from observation patterns and second training vectors generated from estimation targets in order to learn the correlation between observation patterns as inputs and patterns of the estimation targets such that desired outputs are assumed from the inputs, calculating the auto-correlation information of the two training vectors, and cross-correlation information of an average vector, the first training vectors and second training vectors, and using the information, obtaining probable expectation values based on the Bayes theory of the estimation targets with respect to an input pattern.

REFERENCES:
patent: 2978675 (1961-04-01), Highleyman
patent: 5016282 (1991-05-01), Tomono et al.
patent: 5283839 (1994-02-01), Edelman et al.
patent: 5754693 (1998-05-01), Takesue et al.
patent: 6044168 (2000-03-01), Tuceryan et al.
patent: 6178261 (2001-01-01), Williams et al.
patent: 6301387 (2001-10-01), Sun et al.
patent: 6628811 (2003-09-01), Nagao et al.
patent: 6888955 (2005-05-01), Masumoto et al.
patent: 2001/0028731 (2001-10-01), Covell et al.
patent: 2002/0012454 (2002-01-01), Liu et al.
patent: 2003/0016846 (2003-01-01), Chen et al.
patent: 2003/0026484 (2003-02-01), O'Neill
patent: 0350957 (1990-01-01), None
patent: 0944018 (1999-09-01), None
patent: 05303643 (1993-11-01), None
patent: 08063597 (1996-03-01), None
patent: 10228544 (1998-08-01), None
patent: 2001-118068 (2001-01-01), None
patent: 2001014465 (2001-01-01), None
Nagao, K.; “Face Recognition by distribution specific feature extraction”; I.E.E.E. Computer Vision and Pattern Recognition, Jun. 2000, pp. 278-285 vol. 1.
Brunelli, R. et al.; “Face Recognition: features versus templates”, I.E.E.E. Pattern Analysis and Machine Intelligenece; Oct. 1999 pp. 1041-1052 vol. 15 Issue 10.
Nagao, K. et al.; “Direct Object Recognition Using No Higher Than Second Order Statistics of the Image”; Aug. 1995 pp. 360-367 vol. 2.
English Language Abstract of JP Appln. No. 10-228544.
English Language Abstract of JP Appln. No. 05-303643.
English Language Abstract of JP Appln. No. 08-063597.
English Language Abstract of JP Appln. No. 2001-014465.
Brunelli et al., “Face Recognition:Features versus Templates,” IEE Transactions on Pattern Analysis and Machine Intelligence, vol. 15, No. 10, Oct. 1993, pp. 1042-1052.
Bishop, “Neural Networks for Pattern Recognition,” Oxford, 1995, pp. 58-73.

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