Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning
Reexamination Certificate
2006-12-19
2006-12-19
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Circuit tuning
C702S057000, C702S064000, C702S189000, C327S148000
Reexamination Certificate
active
07152009
ABSTRACT:
In a parameter correction circuit in an LSI, a reference resistor element with high precision having a resistance value set to a target value is connected to an external terminal of the LSI. A constant current from a mirror circuit connected to a current supply flows through the reference resistor element. A voltage value generated in the reference resistor element is measured by a voltage measuring circuit. The constant current also flows through a variable resistor element. The resistance value of the variable resistor element is adjusted so that a voltage generated in the variable resistor element corresponds to the voltage generated by the reference resistor element.
REFERENCES:
patent: 5897608 (1999-04-01), Yokoyama et al.
patent: 6205095 (2001-03-01), Hisakado et al.
patent: 6686789 (2004-02-01), Lopata et al.
patent: 6826504 (2004-11-01), Rueger et al.
patent: JP 3-150613 (1991-06-01), None
patent: 04-137902 (1992-05-01), None
patent: 07-055588 (1995-03-01), None
Translation of JP 07-055588.
Translation of JP 04-137902.
Bokui Takahiro
Nishikawa Kazuhiko
McDermott Will & Emery LLP
Wachsman Hal
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