Parameter correction circuit and parameter correction method

Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning

Reexamination Certificate

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Details

C702S057000, C702S064000, C702S189000, C327S148000

Reexamination Certificate

active

07152009

ABSTRACT:
In a parameter correction circuit in an LSI, a reference resistor element with high precision having a resistance value set to a target value is connected to an external terminal of the LSI. A constant current from a mirror circuit connected to a current supply flows through the reference resistor element. A voltage value generated in the reference resistor element is measured by a voltage measuring circuit. The constant current also flows through a variable resistor element. The resistance value of the variable resistor element is adjusted so that a voltage generated in the variable resistor element corresponds to the voltage generated by the reference resistor element.

REFERENCES:
patent: 5897608 (1999-04-01), Yokoyama et al.
patent: 6205095 (2001-03-01), Hisakado et al.
patent: 6686789 (2004-02-01), Lopata et al.
patent: 6826504 (2004-11-01), Rueger et al.
patent: JP 3-150613 (1991-06-01), None
patent: 04-137902 (1992-05-01), None
patent: 07-055588 (1995-03-01), None
Translation of JP 07-055588.
Translation of JP 04-137902.

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