Parallel testing of integrated circuits

Details Parallel testing of integrated circuits Parallel testing of integrated circuits

2005-08-30

2005-08-30

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

06937049

ABSTRACT:
A method for testing in parallel several identical integrated circuit chips with an asynchronous operation, via two physical contacts between a tester and each of the chips, including transmitting on the tester side a first test control signal for the integrated circuit chips, having the test executed in desynchronized fashion by each of the integrated circuit chips, transmitting on the tester side, after a predetermined time interval following the transmission of the first control signal, a second result request control signal to the integrated circuit chips, and having all chips respond synchronously upon reception of said second control signal.

REFERENCES:
patent: 5996099 (1999-11-01), Fournel et al.
patent: 6047019 (2000-04-01), Ishii
patent: 6359826 (2002-03-01), Kim
patent: 6466007 (2002-10-01), Prazeres da Costa et al.
patent: 2002/0176288 (2002-11-01), Nozuyama

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