Parallel test fixture for mixed signal integrated circuits

Details Parallel test fixture for mixed signal integrated circuits Parallel test fixture for mixed signal integrated circuits

2008-06-23

2010-10-26

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07821277

ABSTRACT:
The present invention provides a parallel test fixture for mixed signal integrated circuits (ICs). The fixture includes a multi-layer printed circuit board (PCB). The fixture includes: a test area, which is disposed on a central area of the multi-layer PCB and includes several test regions for a plurality of mixed signal ICs; an analog signal ground layer, which is operationally connected with the analog signals of the mixed signal ICs in the test area; and a digital signal ground layer, which is operationally connected with the digital signals of the mixed signal ICs in the test area. Thereby, when a plurality of mixed signal ICs are parallel tested, not only the problem due to cross-talk could be solved but also the numbers of the layers of the multi-layer PCB could be reduced effectively.

REFERENCES:
patent: 4996478 (1991-02-01), Pope
patent: 5068602 (1991-11-01), Mielke
patent: 6420888 (2002-07-01), Griffin et al.

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