Thermal measuring and testing – Transformation point determination – By change in optical property
Reexamination Certificate
1999-10-08
2003-03-25
Gutierrez, Diego (Department: 2859)
Thermal measuring and testing
Transformation point determination
By change in optical property
C436S147000, C436S181000, C219S497000, C250S341600
Reexamination Certificate
active
06536944
ABSTRACT:
TECHNICAL FIELD
The present invention is directed to combinatorial techniques for characterizing materials, and more particularly to a parallel screen for determining the thermal characteristics of materials by monitoring changes in radiation intensity from members of a combinatorial library as a function of temperature.
BACKGROUND ART
In discovering new materials, the temperature of a material phase change (e.g. melting point) provides important information regarding a particular material. One possible approach for determining such temperatures is to measure the difference between the temperature of the unknown member and a reference member, as in differential scanning calorimetry (DSC) and differential thermal analysis (DTA). Another approach is to monitor changes in the reflectivity or emissivity of the unknown member as a function of temperature. Currently, there is a need for a rapid, high throughput screen that can determine the thermal characteristics of members of a combinatorial library over a large temperature range.
SUMMARY OF THE INVENTION
Accordingly, the invention applies combinatorial materials science techniques in a high-throughput screen for measuring the phase change temperatures of combinatorial libraries of materials. Generally, the invention is directed to correlating the intensity of the radiation emitting from a member with its temperature to obtain its thermal characteristics, and more particularly to correlating the radiation intensity of each member versus time and correlating the temperature of each member versus time to link the member's radiation intensity with its temperature. The invention may include using a detector, such as an infrared camera, to measure the phase change temperature (e.g. melting point) of a plurality of materials on a substrate by, for example, monitoring changes in the radiation, such as the reflectance or emissivity, of a member. In one embodiment, the infrared camera compares the radiation from a substrate to the radiation from a member as a function of temperature. The phase change temperature of the member is obtained by monitoring changes in the ratio between the two radiations as a function of temperature.
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Archibald William B.
Hornbostel Marc
Dobrusin & Thennisch PC
Gutierrez Diego
Pruchnic Jr. Stanley J.
Symyx Technologies Inc.
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