Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate
2006-05-22
2011-11-29
Maskell, Michael (Department: 2881)
Radiant energy
With charged particle beam deflection or focussing
Magnetic lens
C250S281000, C250S282000, C250S290000, C250S292000
Reexamination Certificate
active
08067747
ABSTRACT:
A system for guiding an ion beam along an axis (Z), comprises at least one section having upper flat plate strip electrodes (Iu,2u, 3u, 4uand5u) and lower flat plate strip electrodes (Id,2d, 3d, 4dand5d) for producing at least one electric field of substantially symmetric in a parallel direction and substantially antisymmetric in a perpendicular direction with respect to a plane including a beam axis and a fringe-field boundary that is located at the end of the at least one section.
REFERENCES:
patent: 7012250 (2006-03-01), Aksyuk et al.
H. Wollnik, “Optics of Charged Particles”, 1987, pp. 48-89, Academic. Press, Orlando.
G. Eiceman, et al., 2ndEd. “Ion Mobility Spectrometry” Part II, 2006, pp. 116-240, Taylor & Francis, CRC-Press, Boca Raton.
P.H. Dawson, “Quadrupole Mass Spectrometry and its Application”, Chapter II, 1976, pp. 9-63, Elsevier, Amsterdam.
Maskell Michael
Shimadzu Corporation
Sughrue & Mion, PLLC
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