Superconductor technology: apparatus – material – process – High temperature devices – systems – apparatus – com- ponents,... – Measuring or testing system or device
Patent
1992-08-20
1994-07-05
Wojciechowicz, Edward
Superconductor technology: apparatus, material, process
High temperature devices, systems, apparatus, com- ponents,...
Measuring or testing system or device
257 36, 257 39, 257661, 257662, 257663, 257 31, 307245, 307277, 307306, 324248, 505702, 505846, 505861, H01L 4500, H03K 1792, G01R 3302, H01B 1200
Patent
active
053269861
ABSTRACT:
A physical configuration for a parallel multi-junction superconducting quantum interference device that can be used for a variety of applications involving the detection of magnetic flux, including applications where it is desired to measure the absolute magnitude of the flux. The device of this invention features a novel geometry for a multi-junction interference device which significantly enhances the flux-to-voltage transfer function, thereby yielding a significant improvement in the device sensitivity in its use in a magnetometer, gradiometer, or other applications.
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Golding Terry D.
Huang Jaiming
Miller, Jr. John H.
University of Houston - University Park
Wojciechowicz Edward
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