Parallel integrated circuit test apparatus and test method

Details Parallel integrated circuit test apparatus and test method Parallel integrated circuit test apparatus and test method

2005-05-24

2005-05-24

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB

Reexamination Certificate

active

06897670

ABSTRACT:
A test apparatus (400) comprising a single handler (404) is coupled to a first tester (436) and second tester (408), wherein the first (436) and second (408) testers are coupled together. A first test procedure is performed on a set of second IC's using the first tester (436), simultaneously while a second test procedure is performed on a first set of IC's using the second tester (408). Sets of IC's may be tested in parallel by a plurality of testers (436/408) within a single handler (404). The first (436) and second (408) testers may be coupled to a multiplexer (460) to allow the use of a single test head (478), which avoids having to make contact to the integrated circuit more than once, which is particularly advantageous in wafer probe testing.

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Burns, Mark and Roberts, Gordon, “Focused Calibrations”, An Introduction to Mixed-Signal IC Test and Measurement, Oct. 2000, pp. 369-401, ISBN 095140168, Oxford University Press, New York, New York.

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