Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-09-12
2006-09-12
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07106081
ABSTRACT:
A parallel calibration system for an electronic circuit tester comprises test and measurement electronics, a test fixture coupled to the test and measurement electronics, the test fixture comprising clock reference circuitry and clock distribution circuitry, a device under test interface, and a plurality of calibration boards coupled to the device under test interface, wherein the plurality of calibration boards and the clock distribution circuitry simultaneously test the signal paths of a plurality of test channels.
REFERENCES:
patent: 3832575 (1974-08-01), Dasgupta et al.
patent: 5083083 (1992-01-01), El-Ayat et al.
patent: 5212443 (1993-05-01), West et al.
patent: 5262716 (1993-11-01), Gregory et al.
patent: 5539305 (1996-07-01), Botka
patent: 6025708 (2000-02-01), Stickler
patent: 6114869 (2000-09-01), Williams et al.
patent: 6192496 (2001-02-01), Lawrence et al.
patent: 6492797 (2002-12-01), Maassen et al.
patent: 6570397 (2003-05-01), Mayder et al.
patent: 6876938 (2005-04-01), Kattan
patent: 6931338 (2005-08-01), Kattan
patent: 6956365 (2005-10-01), Niv et al.
patent: 7043959 (2006-05-01), Ibane
patent: 2005/0046436 (2005-03-01), Frankowsky et al.
patent: 2293700 (1996-04-01), None
Bailey Randy L.
Jafari Nasser Ali
Mayder Romi
Sholl Todd
Tse Andrew
Hollington Jermele
Verigy IPco
LandOfFree
Parallel calibration system for a test device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Parallel calibration system for a test device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Parallel calibration system for a test device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3538210