Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-04-20
2009-06-09
Dole, Timothy J (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S523000, C324S076830, C702S069000, C702S112000
Reexamination Certificate
active
07545155
ABSTRACT:
A method for making electrical measurements of a first and a second DUT, the DUTs being in sufficient proximity to exhibit crosstalk therebetween, the method comprising: applying a first signal to the first DUT; applying a second signal to the second DUT, the first signal and the second signal being contemporaneous and orthogonal to each other; measuring a first DUT response; and measuring a second DUT response. The first and second DUT responses exhibit independence from the second and first signals, respectively.
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Efficient Microwave Bias and Testing Using the HP 4142B Modular DC Source/Monitor. Hewlett Packard. Application Note 1205 (Date: At least as early as Aug. 30, 2006.).
Baldridge Benjamin M
Dole Timothy J
Keithley Instruments Inc.
Pearne & Gordon LLP
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