Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-02-12
1993-03-30
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324672, 324675, 324682, G01R 2726
Patent
active
051987775
ABSTRACT:
Apparatus for detecting thickness which includes an electrode detecting unit including a ground electrode and a detecting electrode. The electrodes oppose each other along a paper path. An oscillating circuit provides an oscillation frequency signal. A resonant circuit, having a resonator independent of the oscillating circuit, has a resonance point which changes in accordance with a change in electro-static capacitance corresponding to a change in paper thickness detected by the electrode detecting unit. A resonant circuit outputs a detection signal corresponding to the change in resonance point. By analyzing this detecting signal, a state of two sheets of paper passing through the path is detected as a change in paper thickness.
REFERENCES:
patent: 2562575 (1951-07-01), Raesler
patent: 3300716 (1967-01-01), Engert
patent: 3341774 (1967-09-01), Dyben
patent: 3519922 (1970-07-01), Nash et al.
patent: 3609735 (1971-09-01), Dauterman et al.
patent: 4528655 (1985-07-01), Tamura et al.
patent: 4951800 (1990-08-01), Yoshihara
Measurement Techniques vol. 32, No. 7, Jul. 1989, pp. 647-649, N.Y., U.S.; V. K. Fedotov: "Capacitance Thickness Range for Conducting Films".
Fujii Yasutaka
Masuda Noboru
Oosawa Tetsuo
Harvey Jack B.
Murata Mfg. Co. Ltd.
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