Geometrical instruments – Gauge – Plural tests
Patent
1994-04-29
1995-06-27
Fulton, Christopher W.
Geometrical instruments
Gauge
Plural tests
33546, 33552, G01B 7287
Patent
active
054268621
ABSTRACT:
A panel testing apparatus for measuring the curvature of an inner surface, the thickness of an edge portion, and the thickness of a center portion of the panel comprises a lifting device for accepting and transporting the panel to a testing position, and a panel supporting device for maintaining the panel in a predetermined position during testing. The apparatus comprises a panel inner curvature measuring device, edge thickness measuring device, and a center thickness measuring device, each of which using one or more linear variable differential transformers for the purpose of providing panel measurement data. The apparatus further comprises a studpin leveling device for measuring the burial depth of studpins within the panel and simultaneously leveling the studpins to the same height, and a studpin position measuring device for measuring the horizontal and/or vertical placement of the studpins within the panel, each of which using one or more linear variable differential transformers for the purpose of providing studpin measurement data.
REFERENCES:
patent: 2748490 (1956-06-01), Tandler
patent: 4221053 (1980-09-01), Bobel, II et al.
patent: 4309824 (1982-01-01), Fuchs
patent: 4473953 (1984-10-01), Sauvage
patent: 4914827 (1990-04-01), Cook
Ham Chung-sik
Kim Jong-duk
Lee Ho-sung
Fulton Christopher W.
Samsung Corning Co., Ltd.
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