Panel inspection apparatus and inspection method

Details Panel inspection apparatus and inspection method Panel inspection apparatus and inspection method

2011-07-26

2011-07-26

Saint Surin, Jacques M (Department: 2856)

Measuring and testing

Vibration

Resonance, frequency, or amplitude study

C073S584000, C073S588000, C073S602000

Reexamination Certificate

active

07984649

ABSTRACT:
A panel inspection apparatus includes a resonant frequency extracting unit for extracting a plurality of resonant frequencies of a panel, a resonant frequency selecting unit for selecting a combination of resonant frequencies consisting of two resonant frequencies A and B with different vibration propagation paths among the extracted plurality of resonant frequencies, a non-defective range generating unit for generating a non-defective range on a coordinate system in which resonant frequencies A and B are taken on coordinate axes by statistically processing a set of the resonant frequencies A and B selected for each of a plurality of non-defective panels determined as non-defective in advance, and a panel quality determining unit for determining whether the quality of the panel to be inspected is good based on comparison between resonant frequencies A and B selected for the panel to be inspected and the non-defective range generated by the non-defective range generating unit.

REFERENCES:
patent: 5874676 (1999-02-01), Maki, Jr.
patent: 6031917 (2000-02-01), Mathur
patent: 6138996 (2000-10-01), Hayashi et al.
patent: 7346177 (2008-03-01), Willems
patent: 09-171008 (1997-06-01), None
patent: 2007-147512 (2007-06-01), None

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