Surgery – Diagnostic testing – Touch or pain response of skin
Reexamination Certificate
2008-07-15
2008-07-15
Hindenburg, Max (Department: 3736)
Surgery
Diagnostic testing
Touch or pain response of skin
C600S552000, C600S553000, C600S554000, C600S555000
Reexamination Certificate
active
07399281
ABSTRACT:
A pain measurement system is capable of accurately and reliably measuring the magnitude of temporary pain in a patient while reducing burdens on the patient during pain measurement. The pain measurement system has a system assembly including a controller that controls an electric stimulus signal output unit to apply a pulse current which increases with time through an electrode. The value of the pulse current is recognized as a minimum sensed current value when a first signal is received. The electric stimulus signal output unit is then controlled to apply, through the electrode, a pulse current having a current value which increases from a predetermined initial value stepwise by nX (where X represents the minimum sensed current value and n represents a positive rational number). The current value of the pulse current is recognized as a pain-commensurate current value when a second signal is received.
REFERENCES:
patent: 4763666 (1988-08-01), Strian et al.
patent: 5191896 (1993-03-01), Gafni et al.
patent: 5363859 (1994-11-01), Tuckett et al.
patent: 5806522 (1998-09-01), Katims
patent: 6113552 (2000-09-01), Shimazu et al.
patent: 6146334 (2000-11-01), Laserow
patent: 6387054 (2002-05-01), Laserow
Ishii Takeo
Shimazu Hideaki
Buchanan & Ingersoll & Rooney PC
Dougherty Sean P
Hindenburg Max
Terumo Kabushiki Kaisha
LandOfFree
Pain measurement system and method of measuring pain does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Pain measurement system and method of measuring pain, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pain measurement system and method of measuring pain will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2812986