Packaged semiconductor device with test circuits for determining

Details Packaged semiconductor device with test circuits for determining Packaged semiconductor device with test circuits for determining

1990-03-15

1990-11-13

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 324158T, G01R 3128

Patent

active

049704540

ABSTRACT:
A test circuit (40) fabricated in an integrated circuit and connected to an I/O pin (36) of the packaged device (32) for providing information indicative of substrate process parameters. The test circuit (40) comprises a test transistor (24) connected to a pin (36) of the packaged device (32), and an isolation circuit (52) responsive to a signal on an input test terminal (48) for activating the test transistor (24). The isolation circuit (52) is responsive to the absence of the test signal for isolating the test transistor (24) from the pin (36), and thus isolating it from other functional circuitry (54) of the integrated circuit which is also connected to the pin (36).

REFERENCES:
patent: 4286173 (1981-08-01), Oka et al.
patent: 4336495 (1982-06-01), Hapke
patent: 4339710 (1982-07-01), Hapke
patent: 4398146 (1983-08-01), Draheim et al.
patent: 4450402 (1984-05-01), Owen, III
patent: 4550289 (1985-10-01), Kabashima et al.
patent: 4612499 (1986-09-01), Andresen et al.
patent: 4698588 (1987-10-01), Hwang et al.
patent: 4706157 (1987-11-01), Shimazu
patent: 4733168 (1988-03-01), Blankenship et al.
patent: 4743841 (1988-05-01), Takeuchi
patent: 4764924 (1988-08-01), Mate

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