Package having bond-sealed underbump

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Having light transmissive window

Reexamination Certificate

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C257S680000, C257S433000, C257S704000

Reexamination Certificate

active

07067355

ABSTRACT:
A package for containing microelectromechanical devices includes a first substrate wafer, and a second substrate wafer made of an optical quality material. An underbump is interposed between the first and second substrate wafers. The underbump is composed of a standoff region and a localized bond region. The first and second substrate wafers and the underbump define a chamber that contains at least one microelectronic device.

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patent: 2002/0179921 (2002-12-01), Cohn
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MSDS for CYCLOTENE® 4026-46 Advanced Electronics Resin, The Dow Chemical Company, Midland, MI, 10 pages, Nov. 20, 2001.
MSDS for CYCLOTENE® 4022-35 Advanced Electronics Resin, The Dow Chemical Company, Midland, MI, 10 pages, Nov. 20, 2001.
Sammon, T., H. Schofield, A. Arzumanyan, and D. Kinzer, “A New Generation of Wafer Level Packaged HEXFET® Devices,” International Rectifier, 4 pages, as presented at PCIM Europe 2000.

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