P-type GaAs single crystal and its production method

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Havin growth from molten state

Reexamination Certificate

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C117S081000, C117S083000, C117S084000, C117S956000, C423S087000, C252S0623GA

Reexamination Certificate

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10393984

ABSTRACT:
A p-type GaAs single crystal containing Si, Zn, B and In as dopants has an average dislocation density of 100 cm−2or less. It may be produced by cooling a GaAs melt containing Si, Zn, B and In as dopants in a crystal-growing container having a seed crystal placed at a lower end thereof in an upward increasing temperature gradient, to cause a single crystal to grow upward from the seed crystal.

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patent: 200-086398 (2000-03-01), None
James Mayer and S.S. Lau, Electronic Materials Science: For Integrated Circuits in Si and GaAs, 1990, pp. 38-40 and 43-44.

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