Overvoltage detection apparatus, method, and system

Details Overvoltage detection apparatus, method, and system Overvoltage detection apparatus, method, and system

2006-09-05

2006-09-05

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S679000

Reexamination Certificate

active

07102358

ABSTRACT:
A transistor may have degraded characteristics because of an overvoltage condition. The degraded characteristics may be sensed to determine that the transistor has previously been subjected to an overvoltage condition.

REFERENCES:
patent: 5426375 (1995-06-01), Roy et al.
patent: 5751179 (1998-05-01), Pietruszynski et al.
patent: 6161213 (2000-12-01), Lofstrom
patent: 6201444 (2001-03-01), Sevic et al.
patent: 6724214 (2004-04-01), Manna et al.
patent: 6815971 (2004-11-01), Wang et al.

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