Oversampling analog-to-digital converter with improved DC...

Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion

Reexamination Certificate

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C341S143000

Reexamination Certificate

active

06411242

ABSTRACT:

FIELD OF THE INVENTION
The present invention relates to oversampling analog-to-digital converters. More particularly, the present invention relates to methods and apparatus for improving the direct current (DC) offset and offset drift performance of an oversampling analog-to-digital converter.
BACKGROUND OF THE INVENTION
Converting a continuous-time analog signal to a discrete-time digital representation typically requires anti-alias filtering, sampling and quantization. An anti-aliasing filter ensures that analog input signal is properly band-limited prior to sampling. A sampler captures samples of the filtered input signal at discrete time intervals T=1/F
s
, where F
s
is the sampling frequency. Sampling frequency F
s
typically is selected as at least twice the bandwidth of the filtered analog input signal. A quantizer converts the samples to a discrete set of values. Conventional analog-to-digital (A/D) converters typically perform sampling and quantization, whereas separate discrete components or integrated circuits perform anti-aliasing.
Oversampling A/D converters, in contrast, sample an analog input signal at a rate NF
s
that is many times greater than twice the bandwidth of the analog input signal. An oversampling converter typically includes an anti-alias filter, a sampler and modulator (quantizer), and a digital filter. The sampler and quantizer operate at the elevated rate NF
s
. The digital filter, typically called a decimator, provides low-pass filtering to suppress signals above F
s
/2, and sample-rate reduction to lower the sample rate to the desired rate F
s
. As a result of the higher input sampling rate, over-sampling converters have less stringent anti-alias filter requirements than traditional converters. In addition, oversampling converters permit lower quantization noise power, and hence improved signal-to-noise ratio compared to traditional converters.
One key requirement for oversampling A/D converters is low DC offset. If the input to an oversampling A/D converter is zero (e.g., 0 volts), the output of the converter ideally is a digital code corresponding to zero. As a result of component mismatches, however, the output of a real A/D converter to a zero input is a digital code that corresponds to a value other than zero. The magnitude of the converter's input-referred DC offset is the magnitude of the DC input signal that causes the A/D converter to produce a zero output. The DC offset of the converter may vary with time and temperature. This phenomenon typically is called “offset drift.” Another key requirement for oversampling A/D converters is low offset drift with time and temperature.
Previously known techniques have been used to improve the DC offset performance of A/D converters. For example, Donald A. Kerth et al., “An Oversampling Converter for Strain Gauge Transducers,” IEEE J. Solid State Circuits, 27(12):1689-96 (December 1992), describes an oversampling &Dgr;-&Sgr; A/D converter architecture that uses chopper-stabilized amplifiers to substantially reduce the overall DC offset of the converter. Nevertheless, the non-ideal chopper amplifier switches contribute DC offset and offset drift proportional to the chopper frequency, which corresponds to the relatively high sampling frequency of the &Dgr;-&Sgr; modulator. Although digital calibration techniques may be used to remove residual DC offset, such techniques are ineffective for correcting offset drift. Further, to increase the converter's resolution, the sampling frequency of the &Dgr;-&Sgr; modulator may be increased. Such increases, however, require that the chopper frequency also must increase, which increases residual offset and offset drift.
An improved offset performance A/D converter is described in Damien McCartney et al., “A Low-Noise Low Drift Transducer ADC,” IEEE J. Solid State Circuits, 32(7):959-967 (July 1997) (“McCartney”). The architecture of the McCartney converter is shown in FIG.
1
. Converter
10
includes analog chopper
12
, buffer amplifier
14
, &Dgr;-&Sgr; modulator
16
, digital chopper
18
, Sinc
3
filter and decimator
20
, and FIR filter
22
. Analog chopper
12
chops analog input signal V
IN
with a square wave of frequency f
chop
. For example, as described by McCartney, if V
IN
is a differential signal, analog chopper
12
may be implemented as a multiplexer that successively reverses the polarity of V
IN
. Buffer amplifier
14
isolates the chopped analog input signal from the succeeding switched capacitor circuitry, and may provide adjustable gain. &Dgr;-&Sgr; modulator
16
samples the output of buffer amplifier
14
at a frequency f
mod
that is much higher than chop frequency f
chop
, and provides a digital data stream at its output. For example, f
mod
=2×N×f
chop
, where N is the oversampling ratio of &Dgr;-&Sgr; modulator
16
. Digital chopper
18
is phase-synchronized with analog chopper
12
, and chops the digital data output of &Dgr;-&Sgr; modulator
16
to provide a digital data steam at a rate f
mod
. Sinc
3
filter and decimator
20
filter and decimate the output data stream of digital chopper
18
to provide a digital stream x (n) at a rate f
mod
/N.
If chopper frequency f
chop
equals f
mod
/(2×N), then successive samples x(n) provided at the output of Sinc
3
filter and decimator
20
are digital representations of the analog signals (V
IN
+V
OS
) and (V
IN
−V
OS
), where V
OS
is the input-referred offset of buffer amplifier
14
and &Dgr;-&Sgr; modulator
16
. For example, x(n) for n=0, −1, −2, 3, −4, may be expressed as:
x
(0)=(
V
IN
(0)+
V
OS
(0)
x
(−1)=(
V
IN
(−1)−
V
OS
(−1))
x
(−2)=(
V
IN
(−2)+
V
OS
(−2))
x
(−3)=(
V
IN
(−3)−
V
OS
(−3))
x
(−4)=(
V
IN
(−4)+
V
OS
(−4))  (1)
where V
IN
(n), n=0, −1, −2, −3, −4, . . . , are samples of input signal V
IN
, and V
OS
(n), n=0, −1, −2, −3, −4, . . . , are samples of input-referred offset V
OS
.
FIR filter
22
removes V
OS
from output x(n) of Sinc
3
filter and decimator
20
and provides digital output signal y(n) at rate f
chop
. If FIR filter
22
has L coefficients h(n), n=0, 1, 2, . . . , L−1, output y(n) may be expressed as:
y

(
n
)
=

k
=
0
L
-
1



h

(
k
)
×
(
n
-
k
)
(
2
)
For example, if L=2, output y(n) may be expressed as:
y
(
n
)=
h
(0)
x
(
n
)+
h
(1)
x
(
n−
1)  (3)
For n=0, y(0) equals:
y

(
0
)


=
h

(
0
)
×
(
0
)
+
h

(
1
)
×
(
-
1
)


=
h

(
0
)

[
V
IN

(
0
)
+
V
OS

(
0
)
]
(
4

a
)


+
h

(
1
)

[
V
IN

(
-
1
)
-
V
OS

(
-
1
)
]
(
4

b
)
If f
chop
is many times higher than twice the bandwidth of V
IN
and V
OS
, then
V
IN
(0)≈
V
IN
(−1)  (5a)
V
OS
(0)≈
V
OS
(−1)  (5b)
Ideally, y(n) contains no offset V
OS
, such that
y
(
n
)=
V
IN
(
n
)  (6)
Combining equations (4b), (5) and (6), impulse response coefficients h(0)=+0.5 and h(1)=+0.5.
An alternative embodiment of the converter of
FIG. 1
is shown in FIG.
2
. Circuit 30 includes excitation source
32
, analog chopper
34
, sensor
36
and A/D converter
38
. Excitation source provides analog excitation input signal E
IN
, and sensor
36
may be, for example, a resistor bridge strain gauge used in an industrial weigh scale. Analog excitation input signal E
IN
typically is a DC signal. Analog chopper
34
chops analog excitation input signal E
IN
, and provides the chopped signal to resistor bridge
36
. The analog output of resistor bridge
36
is the input to A/D converter
38
. A/D converter
38
includes chop synch
40
, which provides analog chopper
34
with a clock signal of the correct polarity and phase to synchronize analog chopper
34
to A/D converter
38
. By inc

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